Ik ben niet zo een draadjes opener, mijn excuses alvast.
Ik las onderstaand bericht en het begon me aan alle kanten te jeuken.
Ik wilde bellen, faxen, wappen,mailen, schrijven, schreeuwen, en vooral de boodschap overbrengen.
Wij hebben al een oplossing voor niet alle, maar vele problemen,
The cost of testing a transistor will approach and may exceed the cost of manufacturing it, Professor Bashir Al-Hashimi at the University of Southampton, has warned.
Al-Hashimi, who is at the university’s school of electronics and computer science, will outline his prediction at the European Test Symposium that is in Southampton, U.K. next week.
“This is a serious matter for the electronics industry and the need to introduce novel test techniques to try to prevent this from happening has become more pressing,” said Al-Hashimi.
Professor Stephen Furber at the computer engineering department at the University of Manchester, also speaking at the event, says the big challenge to be addressed is more effective testing of semiconductor devices.
“I will suggest that the workings of the brain might provide the key to better chip design and test processes,” said Furber.
Al-Hashimi believes that as the scaling down of CMOS transistors alongside system-on-chip design flow meet the demand for lower cost, highly reliable products, testing is becoming more difficult and costly.
The cost of test can be calculated by adding factors such as: test preparation; test execution; puting design-for-test features such as chain scans onto a die; and the cost of imperfect testing.
However, the cost of imperfect testing is not just down to good chips being thrown away because the tests are not accurate enough to prevent them being flagged as faulty.
“There are also costs associated with circuits that are slowed down by having to include large scan chains,” said Al-Hashimi.